| PART |
Description |
Maker |
| TLP3114 |
Logic IC Testers/memory Testers Board Testers/Scanners
|
Toshiba Semiconductor
|
| TLP354207 |
TESTERS DATA RECORDING EQUIPMENTS
|
Toshiba Corporation
Toshiba Semiconductor
|
| 1670G 1672G 1673G |
1670G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 136 Channels, 128K Memory
1672G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 68 Channels, 128K Memory
1673G Standalone Logic Analyzer with 500 MHz Timing/150 MHz State, 34 Channels, 128K Memory
|
Agilent (Hewlett-Packard)
|
| 5523 3781 |
Connector assemblies, Hooks Test; RoHS Compliant: Yes INTERCONNECTION DEVICE
Minigrabber Test Clip Patch Cord
|
Pomona Electronics
|
| 0040.1012 0040.1013 0040.1015 0040.1011 0040.1014 |
TEST JACKS, TEST PROBES / PRUFSTECKER, PRUFBUCHSEN
|
Schurter Inc.
|
| CAT28F002 CAT28F002PI-90BT CAT28F002NI-90BT CAT28F |
90ns 2M-bit CMOS boot block flash memory
150ns 2M-bit CMOS boot block flash memory
120ns 2M-bit CMOS boot block flash memory
2 Megabit CMOS Boot Block Flash Memory
High Speed CMOS Logic 8-Stage Shift-and-Store Bus Register with 3-Stage Outputs 16-PDIP -55 to 125
|
http://
CATALYST[Catalyst Semiconductor]
|
| AM29SL800B AM29SL800BB170EC AM29SL800BB170ECB AM29 |
High Speed CMOS Logic Octal Inverting Bus Transceiver with 3-State Outputs 20-CDIP -55 to 125
8-Bit Identity/Magnitude Comparators (P=Q) with Enable 20-CDIP -55 to 125
High Speed CMOS Logic Quad 2-Input EXCLUSIVE OR Gates 14-CDIP -55 to 125
4-Bit Magnitude Comparator 16-CDIP -55 to 125
High Speed CMOS Logic Dual Positive-Edge Trigger D Flip-Flops with Set and Reset 14-CDIP -55 to 125
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 200 ns, PBGA48
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 8兆位 M中的x 8-Bit/512亩x 16位）.8伏的CMOS只超低电压快闪记忆体
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 170 ns, PDSO48
8 Megabit (1 M x 8-Bit/512 K x 16-Bit) CMOS 1.8 Volt-only Super Low Voltage Flash Memory 1M X 8 FLASH 1.8V PROM, 200 ns, PDSO48
|
Advanced Micro Devices, Inc.
|
| BC213A BC214B BC214A BC213C BC158B BC158A BC147B B |
Programmable Logic IC; Logic Type:Programmable; No. of Macrocells:102; Package/Case:144-TQFP; Number of Circuits:1728; Mounting Type:surface mount
Programmable Logic IC; Logic Type:Programmable; No. of Macrocells:147; Package/Case:208-PQFP; Leaded Process Compatible:No; Number of Circuits:1728
Programmable Logic IC; Logic Type:Programmable; No. of Macrocells:176; Package/Case:256-FBGA; Leaded Process Compatible:No; Number of Circuits:1728
Programmable Logic IC; Logic Type:Programmable; No. of Macrocells:102; Package/Case:144-TQFP; Leaded Process Compatible:No; Number of Circuits:576
; Temperature, operating range:-40(degree C) to (degree C); Base number:16; IC Generic RoHS Compliant: Yes
; Temperature, operating range:-40(degree C) to (degree C); Base number:1; IC Generic RoHS Compliant: Yes
FPGA, FLEX 10K, 10K GATES, PQFP208; Logic IC family:FPGA; Logic IC Base Number:10; Logic IC function:EPF10K10; Voltage, supply:5.0V; Case style:PQFP
MAX 3000A CPLD 128 MC 100-TQFP
MAX 7000 CPLD 128 MC 100-PQFP
Stratix II GX FPGA 60K FPGA-780 晶体管|晶体管|进步党| 20V的五（巴西）总裁| 100mA的我（丙
Stratix II FPGA 60K FBGA-672 晶体管|晶体管|叩| 45V的五（巴西）总裁| 100mA的我（丙
SERIAL CONFIG MEMORY, 16M, SOIC16; Memory type:FLASH; Memory size:16MB; Temp, op. min:-40(degree C); Temp, op. max:85(degree C); Case style:SOIC; Temperature, operating range:-40(degree C) to (degree C); Base number:16; IC Generic RoHS Compliant: Yes
|
Golledge Electronics, Ltd.
STMicroelectronics N.V.
|
| 1760 |
WOODHEAD? TESTERS PERFORM BASIC-VERIFICATION AND MULTIFUNCTION WIRE TESTING WITH COMPACT, SIMPLE-TO-USE DEVICES THAT
|
Molex Electronics Ltd.
|
| AT29LV512-25TI AT29LV512-25TC AT29LV512-25JI |
512K 64K x 8 3-volt Only CMOS Flash Memory
High Speed CMOS Logic Quad 2-Input NAND Gates 14-PDIP -55 to 125
High Speed CMOS Logic 4-Bit Binary Ripple Counter 14-SOIC -55 to 125
|
Atmel Corp.
|
| 0040.1022 0040.1023 0040.1021 40.1024-ND 0040.1151 |
TEST JACKS, TEST PROBES
|
Schurter Inc.
|
